October 29, 2013
PHI Introduces X-tool Automated XPS Microprobe
October 28, 2012
PHI Introduces 710 Scanning Auger Nanoprobe
April 20, 2012
PHI European User Meeting 2012
April 4, 2011
Update on ULVAC-PHI in Chigasaki, Japan
February 22, 2011
PHI Presentation and Workshop at Drexel University
November 29, 2010
PHI Receives Product Award for the Gas Cluster Ion Beam (GCIB) Source
November 9, 2010
Introducing the Gas Cluster Ion Beam Ion Gun
November 8, 2010
PHI XPS User at PNNL/EMSL
