News & Articles

December 19, 2024

Beyond Chemical Composition: How Surface Science Can Measure Electronic Properties

Learn More
November 15, 2024

Surface Characterization of High-Performance Battery Materials

Learn More
October 29, 2024

Exploring the Power of TOF-SIMS by Coupling Collision-Induced Dissociation and Surface-Induced Dissociation

Learn More
October 15, 2024

Revolutionizing Thin Film Analysis: Non-Destructive Techniques for Advanced Technology Applications

Learn More
October 1, 2024

Post-Synthesis Characterization of PtNi Nanowires for Enhanced Durability and Efficiency

Learn More
September 26, 2024

Application Note - Mosaic Mapping for Analysis of Heterogeneous Battery Degradation

Learn More
September 16, 2024

Mosaic Mapping for Analysis of Heterogeneous Battery Degradation

Learn More
August 20, 2024

Insights Into Battery Chemistry Using TOF-SIMS, XPS, and AES

Learn More
July 30, 2024

Non-destructive Depth Profiling of Multilayer Films Utilizing XPS/HAXPES

Learn More
18725 Lake Drive East, Chanhassen, MN 55317
© 2024 Physical Electronics, Inc. (PHI) All Rights Reserved.
© 2024 Physical Electronics, Inc. (PHI) All Rights Reserved.
Cookies