News & Articles

July 15, 2024

Utilizing Ultraviolet Photoemission Spectroscopy (UPS) and Low Energy Inverse Photoemission Spectroscopy (LEIPS) to Gain Thermodynamic Insight into Real World Battery Materials

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June 6, 2024

Multi-Technique Characterization of PtNi Nanowires for Enhanced Durability and Efficiency

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May 13, 2024

XPS Insights into Chemical Degradation Mitigation of Protective Coatings on NCM Cathodes

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May 6, 2024

Exploring the Power of TOF-SIMS by Coupling Collision-Induced Dissociation with Surface-Induced Dissociation for Structural Analysis

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April 23, 2024

Upcoming SmartSoft- AES Software Release

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April 17, 2024

Interview with ULVAC-PHI President

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February 21, 2024

XPS Insights of Fluorinated Ether Electrolyte for High Voltage Li Metal Batteries

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February 7, 2024

Surface Analysis Spotlight Part 4: Concluding Perspectives on Advanced Thin Film Characterization via StrataPHI 2.0 Software

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January 24, 2024

Impact of PHI XPS instruments on scientific discovery

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© 2024 Physical Electronics, Inc. (PHI) All Rights Reserved.