News & Articles
July 30, 2024
Non-destructive Depth Profiling of Multilayer Films Utilizing XPS/HAXPES
July 15, 2024
Utilizing Ultraviolet Photoemission Spectroscopy (UPS) and Low Energy Inverse Photoemission Spectroscopy (LEIPS) to Gain Thermodynamic Insight into Real World Battery Materials
June 6, 2024
Multi-Technique Characterization of PtNi Nanowires for Enhanced Durability and Efficiency
May 13, 2024
XPS Insights into Chemical Degradation Mitigation of Protective Coatings on NCM Cathodes
May 6, 2024
Exploring the Power of TOF-SIMS by Coupling Collision-Induced Dissociation with Surface-Induced Dissociation for Structural Analysis
February 21, 2024
XPS Insights of Fluorinated Ether Electrolyte for High Voltage Li Metal Batteries
February 7, 2024
Surface Analysis Spotlight Part 4: Concluding Perspectives on Advanced Thin Film Characterization via StrataPHI 2.0 Software
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© 2025 Physical Electronics, Inc. (PHI)
All Rights Reserved.