News & Articles
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December 12, 2023
Surface Science Discoveries: Using TOF-SIMS in Quantum Computing & Battery Innovation
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December 4, 2023
Surface Analysis Spotlight Part 3: What Range of Film Thickness Can StrataPHI Calculate from Angle-Resolved XPS and HAXPES Spectra?
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November 10, 2023
XPS Chemical State Analysis of N-Doped Carbon Surface Coatings for Improved Battery Stability
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October 25, 2023
Surface Analysis Spotlight Part 2: The StrataPHI Approach to Reconstructing the Depth Distribution of Multi-Layered Thin Films Non-Destructively
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October 6, 2023
Ensuring successful experiments when moving beyond XPS: a comparison of the experimental requirements for LEIPS, UPS, and REELS
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September 15, 2023
Surface Analysis Spotlight Part 1: How Does Angle-Resolved X-Ray Photoelectron Spectroscopy Capture the Depth Distribution of Multi-Layered Thin Films?
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September 8, 2023
In-situ XPS: Investigating Stable Interfaces for Improved Solid-State Battery Performance
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© 2024 Physical Electronics, Inc. (PHI)
All Rights Reserved.