Organic Photovoltaics - TOF-SIMS

The complex chemistry of organic photovoltaic films make PHI TOF-SIMS instruments an attractive option for compositional characterization of these films. Using an argon gas cluster ion beam for sputtering and a liquid metal ion gun for analysis, characteristic mass fragments of the various materials in the complex film structure are observed.

TOF-SIMS sputter depth profile of an organic photovoltaic film structure showing the ability to observe characteristic mass fragments of the organic materials and create a detailed compositional depth profile.