Plasma Modified Polymer Surfaces - XPS

PHI XPS instruments can be used to detect ultra thin surface modified layers and quantify the impact of the modification. In this case, the modification incorporated oxygen into the surface of the polyethylene as indicated by the dramatic increase of the O 1s peak after plasma treatment.

XPS spectra of a polyethylene surface before and after plasma modification demonstrating the surface sensitivity of PHI XPS systems for detecting these ultra thin surface layers.

Sample is courtesy of N. De Geyter, University of Ghent, Plasma Technology Research Unit, Applied Physics Dept. , Belgium