Polymeric materials are widely used for structural materials, and coatings in many research and industrial applications. Polymers are often chemically inert and require surface modification to promote properties such as adhesion and wettability. The use of PHI XPS and TOF-SIMS instruments to detect and characterize surface modification or contamination of polymer surfaces is critical to the successful end use of many polymeric materials.
Application Notes
- Additive Identification Using MS/MS (NEW)
- PET Oligomer Identification with MS/MS (NEW)
- Automated QC Analysis Silicone Detection
- C60 Polymer Additive Migration
- Cleaning Polymer Surfaces with the PHI 06-C60 Sputter Ion Gun
- Organic Depth Profiling with the PHI 06-C60 Sputter Ion Gun
- 20 Kv C60 Depth Profiling of Polystryene
- TOF-SIMS of Multi-Layer Paint Coatings
- 3D Characterization of PS/P2VP Block Copolymer Films
- Chemical Imaging at the Interface of a Bulk Elastomer Laminate
- Imaging the Phase Segregation in PS/PMMA Copolymer Blends
- Molecular Imaging of Micron Scale Features
- Optimizing C60 Incidence Angle for Polymer Depth Profiling
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© 2024 Physical Electronics, Inc. (PHI)
All Rights Reserved.
© 2024 Physical Electronics, Inc. (PHI)
All Rights Reserved.