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PHI Introduces 710 Scanning Auger Nanoprobe

Physical Electronics unveiled its latest innovation in scanning Auger, the PHI 710 Scanning Auger Nanoprobe, at the American Vacuum Society’s 59th International Symposium and Exhibition held in Tampa, Florida, October 28 - November 2, 2012. With the new technology users will experience improved secondary electron imaging performance and improved chemical state imaging capabilities.

The 710 is the next generation in scanning Auger and features new electronics that contribute to reduced beam size and enable remote diagnostic capabilities, as well as providing a smaller footprint. The 710 maintains the core capabilities of PHI cylindrical mirror analyzer (CMA) based Auger instruments yet provides the ability to obtain high energy resolution spectra when they are needed. The CMA provides coaxial analyzer and electron gun geometry enabling high sensitivity over a broad range of collection angles to facilitate the complete characterization of the three dimensional structures that are the basis for most nanoscale technology development.