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News & Articles

April 21, 2021

Surface Analysis Spotlight: Ion Guns in XPS Analysis

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April 12, 2021

New Application Note: VersaProbe III a Unique Instrument for Battery Characterization

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April 8, 2021

European/EMEA Workshop Videos

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March 18, 2021

Surface Analysis Spotlight: Challenges of XPS Depth Profiling of Mixed Materials: Organic Metal Halide Perovskites

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February 18, 2021

Surface Analysis Spotlight: Wafer Die Navigation Capabilities

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February 11, 2021

International Day of Women & Girls in Science

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February 1, 2021

FREE 2 Hour ReACH Session

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January 28, 2021

PHI's Fall Workshop Speaker Videos

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January 15, 2021

Surface Analysis Spotlight: Depth Profiling Through Individual Particles – Are You Analyzing What You Think?

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