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Introducing NEW PHI nanoTOF 3

Parallel Imaging MS/MS

TOF-SIMS Tandem MS Imaging

The 7th Generation of TOF-SIMS from PHI

• NEW sleek appearance, ergonomic design, reduced footprint, and reduced power consumption
• NEW fully automated stage design with in-vacuum parking for reliable, high-throughput sample handling
• NEW bismuth LMIG cluster ion emitter with improved spatial resolution

Reliable automation and remote operation

• Highly configurable queuing system for automated unattended analysis and maximum efficiency
• Fully remote operation and advanced remote diagnostics

Patented Turn-Key Dual-Beam Charge Neutralization

• NEW combination of pulsed low-energy electrons and low-energy Ar⁺ ions for robust and truly turn-key insulator analysis in both +ve and -ve ion polarities

Patented Parallel Imaging MS/MS Spectrometer

• Flat and rough samples alike are easily analyzed by the 7^th generation of PH l's triple-focus mass analyzer
• Parallel Imaging MS/MS takes TOF-SIMS peak identification from "I think" to "I know!"
• Lossless and high sensitivity tandem MS analysis of peaks down to < 20 ppm abundance