News & Articles
July 14, 2022
Expanding application of XPS to fuel cells - seeing beyond the surface
March 22, 2022
GCIB Depth Profiling - Do you know the size of the cluster you're using?
August 12, 2021
Curve Fitting in XPS: Resources for Good Practices and Tools for Avoiding Mistakes
July 13, 2021
Surface Analysis Spotlight: Hints and Methods for Use of Tandem MS in TOF-SIMS Data Reduction, Interpretation and Peak Identification
June 2, 2021
Surface Analysis Spotlight: Which Higher Energy X-ray Source is the Most Beneficial for Laboratory HAXPES Measurements
May 20, 2021
Surface Analysis Spotlight: StrataPHI: Automated Thin Film Modeling and High Throughput Metrology Tool for XPS
18725 Lake Drive East,
Chanhassen, MN 55317
© 2024 Physical Electronics, Inc. (PHI)
All Rights Reserved.
© 2024 Physical Electronics, Inc. (PHI)
All Rights Reserved.