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News & Articles

October 25, 2023

Surface Analysis Spotlight Part 2: The StrataPHI Approach to Reconstructing the Depth Distribution of Multi-Layered Thin Films Non-Destructively

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October 6, 2023

Ensuring successful experiments when moving beyond XPS: a comparison of the experimental requirements for LEIPS, UPS, and REELS

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September 15, 2023

Surface Analysis Spotlight Part 1: How Does Angle-Resolved X-Ray Photoelectron Spectroscopy Capture the Depth Distribution of Multi-Layered Thin Films?

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September 8, 2023

In-situ XPS: Investigating Stable Interfaces for Improved Solid-State Battery Performance

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August 4, 2023

The Utility of Surface-Induced Dissociation in Molecular Identification

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June 19, 2023

Exploring Aluminum Anodes for Li-S Batteries Using XPS

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June 1, 2023

Characterization of cathode-electrolyte interface in all-solid-state batteries using AES, TOF-SIMS, XPS, and UPS/LEIPS

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May 15, 2023

HAXPES of GaN  Interface in MOS High Electron Mobility Transistors

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May 8, 2023

Artificial Intelligence (AI) Provides Ease-of-Use in TOF-SIMS Data Reduction

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