Driving Discoveries Through Surface Analysis Thin Film Composition
Driving Discoveries Through Surface Analysis Chemical Imaging
Driving Discoveries Through Surface Analysis Defect Analysis
Driving Discoveries Through Surface Analysis New Materials Development
Driving Discoveries Through Surface Analysis Surface Contamination
Driving Discoveries Through Surface Analysis Additive Manufacturing

PHI Genesis Scanning XPS/HAXPES Microprobe

  • A fully automated multi-technique scanning XPS/HAXPES microprobe
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PHI 710 Scanning Auger Nanoprobe

  • A scanning Auger instrument optimized for high magnification chemical imaging
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PHI nanoTOF 3 Time-of-Flight SIMS

  • A TOF-SIMS instrument optimized for the highest sensitivity elemental and molecular analysis
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Refurbished Factory Certified Refurbished Instruments

  • Performance to Original Specifications
  • Same 1-year Warranty as New Instruments
  • Prices Include Installation, Warranty and Training
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Applications Energy

Physical Electronics XPS, AES, and SIMS surface analysis instruments are playing a critical role in understanding efficiency and lifetime issues related to energy conversion devices, energy storage devices (batteries), and many energy saving technologies.

  • Lithium Battery Electrode Analysis - XPS
  • Fuel Cell Membrane Characterization
  • Solid Oxide Fuel Cell Characterization
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Applications Medical

Physical Electronics XPS and TOF-SIMS instruments are routinely used to characterize the surfaces of implantable medical devices, study the release of drugs from delivery platforms, and more recently to support basic medical research with TOF-SIMS characterization of tissue sections.

  • Drug Absorption
  • 3D Characterization of a Drug Eluting Coating
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Applications Polymers

Polymeric materials are widely used for structural materials, and coatings in many research and industrial applications. Polymers are often chemically inert and require surface modification to promote properties such as adhesion and wettability. The use of PHI XPS and TOF-SIMS instruments to detect and characterize surface modification or contamination of polymer surfaces is critical to the successful end use of many polymeric materials.

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Applications Thin Films

Thin films and coatings are used or applied to an almost limitless range of applications to provide a specific performance characteristic for a broad range of industrial products. These include coatings that provide antistatic properties, corrosion resistance, reduce wear, and promote adhesion; as well as thin films for optical devices, mirrors, semiconductor devices, magnetic media, food wrap, etc.

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Applications Metallurgy

Corrosion and wear, and coatings to prevent corrosion and wear are often studied by XPS to provide quantitative chemical state information and by TOF-SIMS to provide molecular identification if organic materials are involved.

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Applications Magnetic Media

Surface analysis techniques are ideally suited to characterize the nanometer protective coatings and magnetic layers that make up today’s magnetic media. In addition to characterizing the magnetic media, surface analysis equipment plays a key role in the development of read/write heads and the detection and characterization of contaminants on components throughout the disk drive.

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Applications Microelectronics

Microelectronic devices typically consist of a series of thin films that have been patterned to produce a device. The use of surface analysis instruments to characterize the composition of thin films or patterned structures and detect contaminants or process residues is critical to the development of new materials, manufacturing processes, and increasing product yield.

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Techniques XPS/ESCA

X-ray photoelectron spectroscopy (XPS) surface analysis instruments provide elemental and chemical state information by measuring the binding energy of photoelectrons that have been excited with a mono-energetic x-ray beam. With the use of a sputter ion gun to remove material, thin film characterization is also possible.

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Techniques Hard X-Ray Photoelectron Spectroscopy (HAXPES)

Hard X-ray Photoelectron Spectroscopy ( HAXPES) instruments provide information similar to XPS – elemental and chemical state information – but from deeper depths. This opens opportunities for probing thicker film structures and buried interfaces, as well as minimizing the effects of surface contamination and ion-induced chemical damage during depth profiling.
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Techniques TOF-SIMS

PHI's time-of-flight secondary ion mass spectrometry (TOF-SIMS) surface analysis equipment provides elemental, chemical and molecular information by measuring the mass of ions that have been ejected from a samples surface with the use of a focused ion beam.

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Techniques Auger Electron Spectroscopy

Our Auger electron spectroscopy (AES) surface analysis equipment provides elemental and in some instances chemical information with the use of a finely focused electron beam to excite the Auger electrons. The analysis of submicron features is routine and thin film analysis is possible with the use of a sputter ion gun to remove material.

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Recent News & Articles

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November 15, 2024

Surface Characterization of High-Performance Battery Materials

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October 29, 2024

Exploring the Power of TOF-SIMS by Coupling Collision-Induced Dissociation and Surface-Induced Dissociation

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October 15, 2024

Revolutionizing Thin Film Analysis: Non-Destructive Techniques for Advanced Technology Applications

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Upcoming Events

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1/8/2025

UKSAF Winter Meeting 2025

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1/19/2025 - 1/23/2025

50th Conference on the Physics and Chemistry of Surfaces and Interfaces

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2/2/2025 - 2/7/2025

13th Asia Pacific Microscopy Congress 2025

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