Article

StrataPHI Update

We are excited to announce new features and improved functionality in our StrataPHI software.

StrataPHI calculates thickness and coverage for thin-film structures composed of discrete layers from spectral and angle-dependent XPS and HAXPES data.

New features include:
- Estimating the structure of thin-film from HAXPES data with new Cr RSF database
- Calculations of Attenuation Length (AL) using most commonly used IMFP/EAL methods for multiple X-ray sources
- Smart Processing Record tracks model setup and saves optimized structure for future analysis and sharing among users

Learn more here.