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StrataPHI 2.0 Update

We are excited to announce a major update and improved functionality in our StrataPHI software!

StrataPHI 2.0 calculates thickness and coverage for thin-film structures composed of discrete layers from angle-dependent XPS and HAXPES spectral data.

New features include:

• Combined angle-dependent XPS and HAXPES data of the same sample to enhance the signal of layers at different depths
• Accurate calculation of fractional coverage
• Simulation mode to determine the best Al/Cr X-ray transitions to acquire for a given multi-layer thin film stack

Learn more here.