Article
Surface Analysis Spotlight: Challenges of XPS Depth Profiling of Mixed Materials: Organic Metal Halide Perovskites
March 18, 2021
Educational Series
New in the spotlight series, XPS depth profiling of challenging mixed materials such as perovskites.
Challenges of XPS Depth Profiling of Mixed Materials: Organic Metal Halide Perovskites
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© 2024 Physical Electronics, Inc. (PHI)
All Rights Reserved.
© 2024 Physical Electronics, Inc. (PHI)
All Rights Reserved.