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Announcing the NEW PHI Genesis - No Compromise!!

PHI Genesis

Fully Automated Multi-Technique Scanning XPS/HAXPES Microprobe

The NEW PHI Genesis combines our successful scanning XPS/HAXPES microprobe product lines into a single instrument - it offers the VersaProbe's multi-technique capabilities together with the Quantes/Quantera's high throughput automated analysis.

It is an easy to use, fully automated system with auto-tuning, calibration, and multiple parking positions for high throughput. PHI's XPS instrument is the only one that scans the X-ray beam, giving it real SEM-like functionality. The fully integrated multi-technique platform of the PHI Genesis offers an array of optional sputter ion sources, and sample treatment and transfer capabilities. These features are essential in studying today’s advanced materials and in supporting your material characterization and problem-solving needs.

This instrument is fully customizable to address all analytical needs.

• Easy to use, fully automated system with auto-tuning and calibration
• High throughput with multiple parking positions
• Fully integrated in-situ multi-technique options − fully customizable to address all analytical needs
• High sensitivity and high throughput for large area and small area under 5 µm
• High-speed XPS depth profiling
• Unique high-throughput non-destructive depth profiling using optional hard X-ray Cr source

For more information about the PHI Genesis.