Event
TOF-SIMS 102: Primary and Secondary Ion Optics and their Influences on Mass Spectrometry and Imaging.
Presented by Dr. Jacob Schmidt
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a well-established analytical technique offering unparalleled insights into surface chemistry, enabling precise analysis of molecular compositions across a diverse list of materials. TOF-SIMS involves bombarding a sample's surface with primary ions, leading to the release and analysis of secondary ions. This technique allows for parallel detection of elemental and molecular ions, the generation of high-resolution 2D and 3D images, and accurate peak identification through tandem MS. TOF-SIMS is a valuable tool for many applications in the pharmaceutical, materials science, energy, and semiconductor industries.
Join us for “TOF-SIMS 102: Primary and Secondary Ion Optics and their Influences on Mass Spectrometry and Imaging” to explore the fundamental principles of Time-of-Flight Secondary Ion Mass Spectrometry. In this webinar we will discuss the core ion optics principles integral to Physical Electronics TOF-SIMS technology, focusing on the TRIFT mass spectrometer and liquid metal ion gun optics, and how these developments impact mass spectrometry and chemical imaging.
