Event

24th International Conference on Secondary Ion Mass Spectrometry (SIMS-24)

Physical electronics is excited to attend the 24th International Conference on Secondary Ion Mass Spectrometry in La Rochelle, France.

Dr. Jacob Schmidt will be presenting a poster on "Insights into Battery Chemistry using TOF-SIMS, XPS, and AES."

SIMS-24 will provide a forum for colleagues from academia and industry from around the world to exchange results and new ideas on Secondary Ion Mass Spectrometry and related techniques.

Learn More

If you are a PHI instrument user, we are hosting a PHI User Reception in the evening on Tuesday, Sept 10. If you would like to attend, please contact us at sales@phi.com for details.