Event
24th International Conference on Secondary Ion Mass Spectrometry (SIMS-24)
September 8 - 13, 2024
Espace Encan Conference CenterLa Rochelle, France
Physical electronics is excited to attend the 24th International Conference on Secondary Ion Mass Spectrometry in La Rochelle, France.
Dr. Jacob Schmidt will be presenting a poster on "Insights into Battery Chemistry using TOF-SIMS, XPS, and AES."
SIMS-24 will provide a forum for colleagues from academia and industry from around the world to exchange results and new ideas on Secondary Ion Mass Spectrometry and related techniques.
If you are a PHI instrument user, we are hosting a PHI User Reception in the evening on Tuesday, Sept 10. If you would like to attend, please contact us at sales@phi.com for details.
18725 Lake Drive East,
Chanhassen, MN 55317
© 2024 Physical Electronics, Inc. (PHI)
All Rights Reserved.
© 2024 Physical Electronics, Inc. (PHI)
All Rights Reserved.