Event

24th International Conference on Secondary Ion Mass Spectrometry (SIMS-24)

Physical electronics is excited to attend the 24th International Conference on Secondary Ion Mass Spectrometry in La Rochelle, France.

Dr. Jacob Schmidt will be presenting a poster on "Insights into Battery Chemistry using TOF-SIMS, XPS, and AES."

SIMS-24 will provide a forum for colleagues from academia and industry from around the world to exchange results and new ideas on Secondary Ion Mass Spectrometry and related techniques.

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