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PHI Workshop at IIT Mumbai

RSIC/SAIF/CRNTS IITB, Mumbai has recently commissioned the PHI TRIFT V nanoTOF Time-of-Flight Secondary Ion Mass Spectrometer (TOF-SIMS).  This is the first TOF-SIMS instrument in the country.  In order to promote the technique associated with TOF-SIMS and other allied surface techniques, a two-day Workshop will be held in association with Physical Electronics Inc., USA and Icon Analytical Equipment Pvt. Ltd., Mumbai, at the Institute Conference Hall and Lab at SAIF, on February 25 and 26, 2010.