Event

FCMN 2022 - International Conference on Frontiers of Characterization and Metrology for Nanoelectronics

Physical Electronics is proud to attend FCMN 2022 - International Conference on Frontiers of Characterization and Metrology for Nanoelectronics.  The FCMN will bring together scientists and engineers interested in all aspects of the characterization technology needed for nanoelectronic materials and device research, development, integration, and manufacturing.

Dr. Kateryna Artyushkova will be presenting a poster on "Successes and Challenges in Applications of a Laboratory-Based Scanning XPS/HAXPES Instrument".

Learn more about FCMN 2022.