Event
4th Advanced Materials Characterization Workshop 2010
Location:
Engineering Sciences Building, Room 190
1101 West Springfield Avenue, Urbana, IL 61801
Physical Electronics is sponsoring the 4th Advanced Materials Characterization Workshop 2010, which will be held June 9 and 10, 2010 at the University of Illinois at Urbana-Champaign.
The Workshop will provide a critical, comparative, and condensed overview of mainstream analytical techniques for materials characterization with emphasis on practical applications and will cover the following techniques:
- atomic force microscopy (AFM)
- x-ray diffraction, reflectivity and fluorescence (XRD, XRR, XRF)
- scanning and transmission electron microscopy (SEM, TEM, STEM)
- focused ion beam (FIB)
- Auger electron spectroscopy (AES)
- x-ray photoelectron spectroscopy (XPS)
- secondary ion mass spectrometry (SIMS)
- Rutherford backscattering (RBS)
- optical spectroscopy (Raman, Photoluminescence, FTIR, ellipsometry), etc.
On Thursday, June 10, at 9:30 AM, a talk entitled “Improving Data Interpretation with AES and XPS”, will be presented by Dr. Ken Bomben of Physical Electronics. Click on the icon below to view a copy of Dr. Bomben's abstract:
For more information, go to http://cmm.mrl.uiuc.edu/Workshop2010/